Sep
26
Soft Errors and No Trouble Found
September 26, 2011 | Leave a Comment
As electronic systems become more complex, troubleshooting manufacturing and field failures becomes more difficult. Hard failures (i.e. permanent changes in a device that lead to reproducible failures) are straightforward to isolate and determine a root cause. The more problematic area is “no trouble found” or NTF – meaning the original failure is difficult (if not [...]
Aug
21
The Value of Defective Devices in the Semiconductor Industry
August 21, 2011 | Leave a Comment
Semiconductor manufacturing employs high volume automated production lines using very complex wafer processing technologies requiring tight controls throughout the flow. Specific physical, optical, chemical and electrical tests are being performed at several stages in the manufacturing flow, to screen out wafer batches, wafers or single devices outside of the tight distribution limits of a given [...]
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