Accelerated Life Testing

September 9-11, 2015 in Boston, MA

The 2015 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from reliability testing. ASTR 2015 is relevant to manufacturers in the aerospace, automotive, consumer electronics, defense, medical, telecommunications and other industries where reliability is a key driver of operational and business success. If your company needs to improve product testing with a goal to improve reliability, reduce warranty costs, improve profits, gain market share, and be more competitive, then the 2015 ASTR Conference is for you!

Abstract Submission Deadline is April 17, 2015; more info here.

For more information about this Conference, visit www.ieee-astr.org

I’m testing LED diodes – life test.

Can anyone help me with determination of upper test temperature?

Operational temperature is -40°C to +50°C.

Can I exceed upper temperature and if so for how much?

Kind regards,
Bla¾
blaz.kramer@yahoo.com