Monthly Archives: July 2015

August 6, 2015

Food sponsored by
ICE Labs, ISO 9001 & 17025 Reliability Test Lab

Title: Macroscopic & Stochastic Aspects of Negative Bias Temperature Instability
Invited Speaker: Souvik Mahapatra, Professor of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India
Time: Check in and food at 6:00PM – 6:30 PM
Presentation from 6:30 PM to 7:30 PM
Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria) (View Map)
Admission: Open to all IEEE members and non-members for FREE!
Abstract: Negative Bias Temperature Instability (NBTI) is a crucial reliability concern for modern day state-of-the-art CMOS technologies. NBTI results in shift in MOSFET parameters, such as threshold voltage, drain current, etc., over time, and therefore causes long-time failure of CMOS integrated circuits. It is very important to understand the fundamental physical mechanism responsible for NBTI and develop suitable models to predict device and resultant circuit degradation at end product life.

In this talk, the underlying physical processes responsible for NBTI in High-K Metal Gate (HKMG) MOSFETs will be briefly reviewed. Defect generation in MOSFET gate oxide will be explained from both macroscopic and stochastic viewpoints, which will be respectively useful to explain NBTI degradation in large and small area devices. This novel simulation framework can explain DC and AC NBTI degradation under various operating conditions such as different operating voltage, temperature, frequency and duty cycle in large area devices, as well as NBTI variability in small area devices. Furthermore, a compact model will be developed to simulate NBTI induced circuit degradation using SPICE simulation, and specific example of variable NBTI impact on SRAM performance parameters, such as read and hold static noise margin and write access time will be discussed.

For more information and to register, visit: Eventbrite Registration

FREE WEBINAR – August 5, 2015

“Another look at Reliability Demonstration Testing (RDT) and Ongoing Reliability Testing (ORT)”

Host: Ops A La Carte
Speaker: Gerry Cohen, Senior Reliability/Quality Consultant
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/7714716006381367298

This webinar will provide a review of how to setup and conduct a Reliability Demonstration Test (RDT), and an Ongoing Reliability Test (ORT). Examples will be presented and discussed, and questions will be answered as time allows.

First Session – July 29, 2015

Date(s): July 29, Aug 12, 19, 20; Sept 1, 3, 16, and 23, 2015, ASQ CRE Exam is on Oct 3, 2015
Time: 3:00pm-7:00pm Pacific time
Instructor: Les Warrington
Length: 8 sessions
Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed.
Location: Via webinar

Description: Becoming certified as a Reliability Engineer (CRE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Reliability Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

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