Monthly Archives: June 2015

FREE WEBINAR – June 10, 2015

Host: Ops A La Carte
Speaker: Indra Desai, Operations Consultant, Guest Speake
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/7714716006381367298

Reliability of products or service provided is critical to the bottom line of any business. Impact of unreliable products or services leaves a bad taste with the customer, which impacts customer loyalty. Finding non-compliances and fixing them is reactive, and may end up as short gap band aids. Thinking about and integrating Reliability from inception helps in retaining customer loyalty. This Webinar will discuss the impact of Reliability and how to avoid the pitfalls. And how to integrate Reliability in Business Process:

• What does reliability mean from customer perspective?
• Impact of non-reliability to bottom line;
• When and how to integrate reliability in Business Process.

We will review case studies of impacts of ‘integrated reliability’.

Food sponsored by
ICE Labs, ISO 9001 & 17025 Reliability Test Lab

Title: Adhesion and Thermomechanical Reliability
Invited Speaker: Prof. Reinhold H. Dauskardt, Professor of Materials Science & Engineering, Stanford University
Time: Check in and food at 6:00PM – 6:30 PM
Presentation from 6:30 PM to 7:30 PM

Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria) (View Map)
Admission: Open to all IEEE members and non-members for FREE!
Abstract: Material layers and interfaces in emerging device packaging and flexible electronic technologies operate near the envelope of their mechanical and adhesive properties with remarkably high levels of film stress. Debonding and cohesive fracture are major challenges for device reliability at all levels of processing, packaging and service. The thermomechanical properties of device structures including complex back-end interconnect, emerging 3-D packages, and flexible organic electronic structures are critical for aiding new materials integration as well as understanding device reliability.

For more information and to register, visit: Eventbrite Registration