Soft Error Rate Count

June 21, 2010 | Leave a Comment

Moshe Valdman from Israel wrote this question: In a telecom system we have many memories and FPGAs Theoretically we should have quite high failure rate related to “single event upset”. I suspect we indeed have such failures, but these could also be just SW “bugs”. I have difficult time convincing developers to add ECC, CRC, [...]

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13

Supply Chain & Quality: Optimizing It

June 13, 2010 | Leave a Comment

To be competitive today, it is imperative that organizations squeeze out waste. In the past, enterprises pursued this with a narrow view – cost reduction efforts. Today’s global environment offers a greater all encompassing opportunity to address factors impacting the total supply chain. Competitive Advantage is the target and one of the key factors is [...]