Monthly Archives: November 2009

I am heading to Taiwan and China right after Thanksgiving to teach my Design for Reliability class.

I would appreciate very much if you could pass these fliers to all your Asian clients in Taiwan and Shenzhen. Below are details and attached is class info for each in Mandarin.

And if you have any clients in either area that would like for me to stop by, please let them know that my available dates are Dec 1 and 3 for visits in Taiwan, Dec 4 for visits in Hong Kong, and Dec 5 in Shenzhen (most companies do work Saturdays there so I guess I will be too). Possibly the afternoon of Dec 8 in Shenzhen or Hong Kong on my way to the airport but that will be tighter).

The cost is $30 USD so it is very very inexpensive – just trying to get exposure out there.

And I am offering all attendees (as well as any of you that successfully refers a client to my seminar) a free e-copy of my brand new book:

“How Reliable Is Your Product? 50 Ways to Improve Your Product Reliability”

The link for registering is:
http://www.opsalacarte.com/Pages/contact/mailform.php?id=news_events_China_seminar

Email for details or for a brochure of the course outline/directions in Mandarin.

Best regards,
Mike Silverman, CRE
Managing Partner, Ops A La Carte, LLC
mikes@opsalacarte.com
www.opsalacarte.com
(408) 472-3889

I’m testing LED diodes – life test.

Can anyone help me with determination of upper test temperature?

Operational temperature is -40°C to +50°C.

Can I exceed upper temperature and if so for how much?

Kind regards,
Bla¾
blaz.kramer@yahoo.com

Product Realization Group (PRG) Lunch and Learn Series Event:

Regulatory Considerations throughout the Product Lifecycle – Panel Discussion

Date: Nov 12, 2009, 11:30am – 1:30pm
Location: National University, 3031 Tisch Way, 100 Plaza East, SJ, CA

This seminar is also available by WEBINAR.

To Register for the live SEMINAR, go to http://www.productrealizationgroup.com/register.php

To Register for the WEBINAR, go to https://www2.gotomeeting.com/register/608702874.

Regulatory compliance is becoming a bigger factor for how products are developed as governments force cleaner materials and business increase their emphasis on sustainable practices. In this seminar, Mike Silverman will host and moderate a dynamic and interactive panel discussion where you will learn about:

• Introduction about how regulatory and reliability are playing big parts in companies today – Mike Silverman, Managing Partner, Ops A La Carte
• Compliance within the medical industry and how it intersects with reliability – David Tu, Senior Reliability Engineer, Ops A La Carte
• Safety/EMC in new and emerging markets, including pitfalls and lessons learned – Lee Ould, CEO, Safety Engineering Labs
• RoHS, WEEE, and REACH, including regulations for different regions (EU, China, Korea, California) – Vineet Chaudhary, Product Marketing, SiliconExpert
• Customer’s perspective to regulatory and how companies deal with this complex set of issues – Ken Kapur, Corporate Compliance Manager, KLA-Tencor

If you are currently engaged in Regulatory Compliance, and are interested in learning more about the changes that are taking place, then this session is for you. To make sure your questions are addressed, please email them in advance when you register or raise them during the session.

Presenters/Panelists:
Mike Silverman, Managing Partner, Ops A La Carte
David Tu, Senior Reliability Engineer, Ops A La Carte
Lee Ould, CEO, Safety Engineering Labs
Vineet Chaudhary, Product Marketing, SiliconExpert
Ken Kapur, Corporate Compliance Manager, KLA-Tencor

Free Webinar: A Faster, Cheaper Method for Determining Product MTBF – the HALT AFR Calculator – Friday, Nov 6, 9am PST

Register at https://www2.gotomeeting.com/register/523479043

Background:

The Field Failure Rate Calculator is a patent pending mathematical model that, when provided with the appropriate HALT and product information, will accurately estimate the product’s field inherent AFR or Actual Failure Rate.

Vocabulary: MTBF is Mean Time Between Failure, AFR is Actual Failure Rate, HALT is Highly Accelerated Life Testing used in design engineering to improve product robustness, HASS is Highly Accelerated Stress Screening using in manufacturing to reduce infant mortalities, HASA is Highly Accelerated Stress Auditing which is an audit form of HASS. Go to www.opsalacarte.com and google those terms for more details.

On October 8, 2009, Ops A La Carte announced their Field Failure Rate Calculator. Ops A La Carte will be hosting a FREE webinar on Friday November 6th 9am PST to demonstrate the tool. For more information on this event, go to http://www.opsalacarte.com/Pages/news/news_events.htm.

The methodology has been used on a number of products with significant positive financial results. This model will also provide HASS or HASA data for the detection of an outgoing quality process shift in time from a stated AFR.

It is a patent pending Excel-based mathematical model that, when provided with the appropriate HALT and product information, will accurately estimate the product’s field AFR or Annual Failure Rate. It has been validated on over thirty products from diverse manufacturers and design environments.

The model will also provide HASS or HASA time to detect a shift in the desired outgoing failure rate.

Here are a few reasons for why and when this model should be used:

• Eliminates the need for prolonged life tests (typically several months long) which will save on development cost, space, and effort. HALT takes only a few days to run and the calculator only takes a few minutes, so the time and cost savings over typical life tests is huge.

• Quickly & accurately estimate field failure rate or Mean Time Between Failure (MTBF).

• More accurate than standard reliability predictions.

• This tool provides accurate estimates of field AFR before launching the product. This can help assure you will meet/exceed your customer expectations and allows you to accurately forecast warranty expenditures.

For more details, go to http://www.opsalacarte.com/Pages/reliability/reliability_prot_halt_calculator.htm