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2016 EVENTS:

Click here for our public Google Calendar at Calendar of Events

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2016 Free Webinar Series - First or Second Wednesday of Each Month 12pm-1:30pm PST

About Event: On the first or second Wednesday of each month, we will bring you a free webinar topic. Below is our next webinar. You can click on the registration page to register for event.

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Coming Up is:

IEEE Consultants' Network of Silicon Valley Event - November 9, 2016
How Artificial Intelligence is Accelerating the Race to Self-Driving Cars
by Danny Shapiro, Senior Director of NVIDIA's Automotive Business Unit

Date: Wednesday, November 9, 2016
Time: 7:00pm - 9:00pm
Location: NVIDIA Corp, 2880 Scott Blvd, Santa Clara 95050
(Meeting will be held in Bldg. E - use East lobby entrance, facing Scott Blvd. - Marco Polo Conference Room)
Admission: Open to all IEEE members and non-members for FREE

Abstract: Virtually every automaker is working on driver assistance systems and self-driving cars. Conventional computer vision used for Advanced Driver Assistance Systems (ADAS) is reaching its limits as it is impossible to write code for every possible scenario in which a vehicle might navigate. Development of a truly autonomous car requires deep learning and artificial intelligence.

With deep learning, the vehicle can be trained to have super-human levels of perception in order to navigate more safely than humanly possible. Based on the same deep learning techniques used for detecting cancer and for beating the world champion Go player, artificial intelligence platforms are destined to enable fully autonomous vehicles.

This talk will cover the details of artificial intelligence in the automotive environment, and how a deep learning "supercomputer in a box" within the car itself will enable the dream of an autonomous vehicle. Also examined will be various implementations currently under development within the industry.

Register here!


FREE RELIABILITY WEBINAR - Nov 9, 2016
Integrating Software Development Best Practices into Product Development for Highly Reliable Software
Host: Ops A La Carte LLC
Guest Speaker: Robert Mueller
Date: Wednesday, November 9, 2016
Time: 12:00 noon - 1:00pm, Pacific Time
Register: https://attendee.gotowebinar.com/register/5857903661721421057

Abstract: The development of highly reliable software intensive products and components is no accident! It is, more often, a consequence of using an integrated, well formed blend of hardware and software development best processes, practices and tools throughout the design, development and testing phases; in other words, effective "Whole Product" Reliability Engineering!

This Webinar will explore the handful of best practices that we have found are almost always used by hardware-software development teams making products that have been demonstrated to be highly reliable. Join us in this in-depth exploration of both what these practices are and how they were deployed and used and also how these can be applied to your development efforts!

Register here!


IEEE Santa Clara Valley Reliability Chapter Meeting
November 3, 2016

CPI Stress Induced Carrier Mobility Shift In Advanced Silicon Nodes by Dr. Valeriy Sukharev, Technical Lead at the Design to Silicon Division (Calibre) of Mentor Graphics Corporation Co-Sponsor: IEEE Electron Devices Society and IEEE CPMT Chapter

Date: Thursday, November 3, 2016
Time: 6:00pm - 6:30pm - Check-in
6:30pm - 8:00pm - Presentation with Q & A
Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B)
Admission: Open to all IEEE members and non-members for FREE

Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab, www.icenginc.com

Abstract: Potential challenges with managing mechanical stress and the consequent effects on device performance for advanced three-dimensional (3-D) IC technologies are outlined. The growing need in a simulation-based design verification flow capable of analyzing and detecting across-die out-of- spec stress-induced variations in MOSFET/FinFET electrical characteristics is addressed. A physics-based compact modeling methodology for multi-scale simulation of all contributing components of stress induced variability is described. A simulation flow that provides an interface between layout formats (GDS II, OASIS), and FEA-based package-scale tools, is developed. The EDA tool-prototype, developed on the basis of proposed methodology, can be used to optimize the floorplan for different circuits and packaging technologies, and/or for the final design signoff, for all stress induced phenomena. A calibration technique based on fitting to measured electrical characterization data is presented, along with correlation of the electrical characteristics to direct physical strain measurements. The limited characterization or measurement capabilities for 3-D IC stacks and a strict "good die" requirement make this type of analysis critical in order to achieve an acceptable level of functional and parametric yield.

Attendance to this seminar will count towards professional development hours for IEEE, ASQ. Please feel free to forward this message to your friends and colleagues.

Register here!


IEEE Santa Clara Valley Reliability Chapter Meeting
October 6, 2016

Reliability and The Self-Driving Car

by Noah Lassar, Manager of Vehicle Reliability, Google[X]
Co-Sponsor: IEEE Vehicular Technology Society

Date: Thursday, October 6, 2016
Time: 6:00pm - 8:00pm
6:00pm - 6:30pm - Check-in
6:30pm - 8:00pm - Presentation with Q & A
Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B)
Admission: Open to all IEEE members and non-members for FREE

All in-person attendees will receive a light lunch. Breaks with snacks and drinks will be part of the seminar experience. Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab

Abstract: Since the automobile was invented over 100 years ago, engineers worked to make cars safer and more reliable. The 20th century witnessed continuous improvements in automotive reliability, coupled with a dramatic reduction in motor vehicle deaths per year. This was largely due to the development of stronger vehicles, active and passive safety systems, and comprehensive reliability development and test programs to weed out reliability and safety issues before they affected customers. At the same time, the driver --the most unreliable part of the car-- underwent no improvements. Given that 94% of traffic accidents involve human error, this is one place where we believe we really can really bring technology to bear. The self-driving car program is aimed squarely at replacing the human driver, and in doing so, making a step function improvement in automotive safety and reliability. Replacing a human driver comes with its share of reliability challenges. But by developing a self-driving vehicle from the ground up, and employing the best design for reliability and reliability test practices, we believe that we will soon live in a world where human-driven cars will seem like a relic of the 20th century.

Attendance to this seminar will count towards professional development hours for IEEE, ASQ. Please feel free to forward this message to your friends and colleagues.

Register here!

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"50 Ways To Improve Product Reliability"
July 2016 - The 2nd Edition Of Mike Silverman's Classic Book

With "How Reliable is Your Product? (2nd Edition)," Mike Silverman and Adam Bahret have delivered what few have done before: a comprehensive yet succinct overview of the field of reliability engineering and testing. Engineers and engineering managers will find much in this book of immediate practical value.

Available now in hardcover on Amazon!!!

Jay and all the Ops Staff

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September 28-30, 2016
2016 Accelerated Stress Testing and Reliability (ASTR) Conference

Pensacola Beach, FL -- The 2016 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from reliability testing. ASTR 2016 is relevant to manufacturers in the aerospace, automotive, consumer electronics, defense, medical, telecommunications and other industries where reliability is a key driver of operational and business success. If your company needs to improve product testing with a goal to improve reliability, reduce warranty costs, improve profits, gain market share, and be more competitive, then the 2016 ASTR Conference is for you.

We have speakers at this conference so make a point to visit their sessions. And please stop by and say 'hi' to us!

For more information, visit www.ieee-astr.org

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August 4, 2016
IEEE Santa Clara Valley Reliability

Chapter Meeting
Surfaces, Interfaces and Microelectronic Packaging
by Dr. Guna Selvaduray, Ph.D.

Date: Thursday, August 4, 2016
Time: 6:00pm - 8:00pm
6:00pm - 6:30pm - Check-in
6:30pm - 8:00pm - Presentation

Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B)
Admission: Open to all IEEE members and non-members for FREE

All in-person attendees will receive a light lunch. Breaks with snacks and drinks will be part of the seminar experience.

Abstract: Of the total cost involved in producing a microelectronic component, between 50% to 90% goes towards the packaging, depending on the specific type of die and packaging technology. However, approximately 95% of the reliability issues are actually related to the packaging rather than the die. There are a variety of surfaces and interfaces, the integrity of which needs to be maintained at all times, in order for the die to be able to function reliably over its service life. Some of these surfaces and interfaces are obvious while others are not. The integrity of these surfaces can have a major impact on the long term reliability of the packaged die. The detailed composition of the interface can also change over time. This presentation will focus on a discussion of the interfacial interactions between Pb-free solders and substrates, the nature of these interactions, the intermetallic compounds (IMC) that are formed, and how these interaction layers can change over time.

Attendance to this seminar will count towards professional development hours for IEEE, ASQ. Please feel free to forward this message to your friends and colleagues. - Register here!

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August / September 2016
Certified Reliability Engineer (CRE) Preparation Course for Fall 2016 - Registration Is Open!!
Date(s): Tentatively starting in August 2016 and running through the end of September 2016; ASQ CRE Exam is scheduled for Oct 1, 2016
Time: 3:00pm-7:00pm Pacific time
Instructor: Les Warrington
Length: 8 sessions
Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed.
Location: Via webinar


Exam Application Deadline: August 12, 2016

Becoming certified as a Reliabililty Engineer (CRE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years.

Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Reliability Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

We look forward to seeing you at all of our events!

Jay and all the Ops Staff

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Wednesday, May 11, 2016
FREE RELIABILITY WEBINAR - "Taking Practical Steps Towards Designing-for-Reliability"

IEEE Santa Clara Valley Reliability Chapter May Meeting
(RSVP BELOW)
Co-Sponsor with ASQ Statistics and Reliability Group

Title: Taking Practical Steps Towards Designing-for-Reliability
Invited Speaker: Mr. Georgios Sarakakis from Tesla Reliability Engineering
Date: Wednesday, May 11, 2016
Time: Check in 6:00PM - 6:30 PM. Presentation with Q&A from 6:30 PM to 8:00 PM.
Location: Applied Materials, Bowers Cafe (aka Campus Cafe), 3090 Bowers Ave, Santa Clara, CA, 95054
Admission: Open to all IEEE members and non-members for FREE
RSVP here: Please send an email two days ahead of time to johnflaig@yahoo.com

Abstract: Design-for-Reliability sounds like a great concept and it has become a common catchphrase across various industries. But what does it really encompass and how do you enable this to happen in an organization? This presentation will provide a detailed insight on the elements of designing-in reliability and what the practical steps are that organizations can take to start moving towards that direction. We call that "swimming upstream" as organizations move from a reactive culture in reliability to a more proactive one, where problems are identified and addressed upstream in the product development process instead of being detected in late testing or in the field.

Biography: Georgios Sarakakis is a Senior Manager of Reliability Engineering at Tesla Motors. He has overseen the reliability development and continuous improvement for the Tesla Roadster, Model S and Model X. As a founding member of the reliability staff at Tesla, he has scaled the team to a world-class organization that drives innovation on multiple fronts, from a data-driven and physics of failure-based approach in Design for Reliability to pairing big data with classical reliability techniques. Prior to joining Tesla, Georgios worked as a Research Scientist at ReliaSoft, where he consulted with various industries, and as a Reliability Engineer at HP, where he worked on the reliability development and launch of the Page Wide Array inkjet technology. Georgios is an author of numerous published papers and articles in the areas of reliability engineering and management. He is a sought-after speaker in the area of product reliability management and strategy. His presentations at ARS have been voted at 1st place in 2013 and 2014 and 2nd place in 2015. In 2014, he won the ASQ Brumbaugh Award for co-authoring the paper that made the largest contribution in the industrial application of quality improvement. Georgios holds an MS in Reliability Engineering from the University of Arizona and an MS in Project Management from George Washington University's School of Business. He is certified as a Project Management Professional, Reliability Engineer, Reliability Professional and Six Sigma Black Belt.

Attendance to this seminar will count towards professional development hours for IEEE, ASQ. Please feel free to forward this message to your friends and colleagues.

Regards,
Sanchan Modi
Secretary, IEEE SCV Reliability Chapter, Email: sanchanmodi@yahoo.com

To Register and for more info, please call 408.654.0499, x203

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May 4, 2016
FREE RELIABILITY WEBINAR - "Advantages of IEEE P1633 for Practicing Software Reliability"

Host: Ops A La Carte
Speaker: Ann Marie Neufelder, Founder, SoftRel LLC
Date: May 4, 2016
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/8970286823844085251

Software reliability engineering has existed for almost 50 years. Software reliability metrics such as failure rate, MTBF, availability and reliability have been used successfully in industry to plan, manage and demonstrate the achievement of system reliability objectives. The newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses during any phase of software or firmware development with any software lifecycle model for any industry or application type.

It includes easy to use models for predicting software reliability early in development and during test and operation. It also provides for methods to analyze software failure modes and include software in a system fault tree analysis.

For persons who are acquiring software it provides the ability to assess the reliability of COTS, FOSS, and contractor or subcontractor delivered software.

This presentation will cover the key features of the IEEE 1633 Recommended Practices for software reliability.

To Register and for more info, please call 408.654.0499, x203

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April 6, 2016
Certified Quality Engineer (CQE) Preparation Course First Session

Date(s): Tentatively one session per week starting April 6, 2016, through Jun 1, 2016; ASQ CRE Exam is scheduled for Jun 4, 2016
Time: 3:00pm-7:00pm Pacific time
Instructor: Greg Swartz and Pat McMahon
Length: 9 sessions
Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed.
Location: Via webinar

Becoming certified as a Quality Engineer (CQE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Quality Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

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April 6, 2016
FREE RELIABILITY WEBINAR - "Conducting an Effective DVT"
Host: Ops A La Carte
Speaker: Gerry Cohen, Senior Reliability Engineer
Date: April 6, 2016
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/1255349082256235777

A Design Verification Testing (DVT) is usually an integral part of many technology provider's qualification process.

But how effective is it in light of design, manufacturing, suppliers and customers?

This webinar will explore several methods and tools useful in conducting DVT.

To Register and for more info, please call 408.654.0499, x203

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April 6, 2016
Certified Quality Engineer (CQE) Preparation Course First Session

Date(s): Tentatively one session per week starting April 6, 2016, through Jun 1, 2016; ASQ CRE Exam is scheduled for Jun 4, 2016
Time: 3:00pm-7:00pm Pacific time
Instructor: Greg Swartz and Pat McMahon
Length: 9 sessions
Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed.
Location: Via webinar

Becoming certified as a Quality Engineer (CQE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Quality Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

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March 17, 2016
5th Annual IEEE International Reliability Innovations Conference

Date: Thursday, March 17, 2016
Time: 8:00 AM - 45:00 PM (Breakfast & Lunch are provided)
Location: Juniper Networks (1194 North Mathilda Ave, Sunnyvale 94089. Building 1, Tuolumne Room)
Attendance: Registration is Free!! Attend on-site or Remote via WebEx

Join us on Thursday, March 17, 2016 for a day of learning, innovation and networking at the 5th Annual IEEE International Reliability Innovations Conference. The conference serves as a leading platform for engineering professionals to share innovative concepts, design, methodologies, tools and applications to address challenges in reliability. Engage in technical sessions, workshops, seminars and panel sessions on the latest advancement and network with like-minded professionals from all over the world.

The conference is brought to you by Cisco Systems, Juniper Networks and OPS Ala carte in collaboration with the IEEE Reliability Society (SCV Chapters), along with our prominent sponsors.

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March 9, 2016
Free Webinar - HALT 101 - Back to Basics

Host: Ops A La Carte
Speaker: John Cooper, Senior Reliability Engineer
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/8806845518889777665

Many of us are involved in HALT testing; sometimes we wonder if we are doing it correctly or why it is done a certain way. Some of us may not understand it and would like a basic review.

This webinar will include an introduction to HALT, an understanding of what it will do, and what it will not do, and how to plan for it. We will explore fixturing, setup, functional verification, and the actual running of the test. We will discuss the real value of HALT.

Advanced topics will be touched on such as pitfalls of HALT, how it can be misunderstood, and some case studies.

Tune in to this webinar for a refresher; invite your associates, such as design engineers or project managers, who would appreciate understanding HALT and might have questions.

To Register and for more info, please call 408.654.0499, x203

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March 3, 2016
IEEE Santa Clara Valley Reliability Chapter Meeting

Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab

Title: Physics- based life distribution and reliability modeling of solid state drives
Invited Speaker: Dr. Alexander Parkhomovsky, Ph.D., Engineering Development Manager at Lumentum
Date: Thursday, March 3, 2016
Time: Check in and food at 6:00PM - 6:30 PM. Presentation from 6:30 PM to 7:30 PM
Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B)

Admission: Open to all IEEE members and non-members

Abstract: The model of solid state drive (SSD) life time distribution from physics-based life model considering the random nature of real world customer data usage and product inherent physical properties is developed. The talk is focused on the following two cases:

Case 1: When only field write duty cycle is treated as a random variable while assuming all other physical characteristics are non-random, it is found that the SSD life time follows . Reciprocal-Weibull distribution when field Write Duty Cycle follows Weibull distribution, . Reciprocal-Exponential distribution when field Write Duty Cycle follows Exponential distribution, . Lognormal distribution when field Write Duty Cycle follows Lognormal distribution, . Reciprocal-Normal Distribution when field Write Duty Cycle follows Normal distribution. The corresponding mathematical expressions for reliability, unreliability, hazard rate, MTTF, etc. are derived for each scenario accordingly.

Case 2: In real world, SSD endurance rating is also a random variable due to part-to-part variance from material in-homogeneity and inherent defects from manufacturing process. Given the distributions of field customer write duty cycle (stress) and SSD endurance rating (strength), the distribution of lifetime random variable can be derived either analytically, if closed form solution exists, or numerically using Monte Carlo simulation if no closed form solution exists. This paper provides a special case where the analytic solution exists when both random variables follow Lognormal distribution. A numerical example is given to show the application of the models developed in this paper. The results derived in this paper will benefit the SSD industry in various aspects of product design, development, reliability testing and prediction, field return/failure estimation and warranty management.

For more information and to register, visit: Eventbrite Registration

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February 10, 2016
FREE WEBINAR - "Setting Up A Viable Multi-Stress Accelerated Life Test"

Host: Ops A La Carte
Speaker: James McLinn, Senior Reliability Engineer
Time: 12:00pm-1:00pm Pacific Time
Register: here

Selecting a set of stresses for accelerated life testing can be a challenge for some accelerated life tests. Determining the best set of stresses is only the start of the reliability challenge. Should one employ a combination of temperature and vibration, temperature and humidity, mechanical stress and temperature, corrosive materials and temperature, temperature cycles and vibration or some other stress combination? If one important goal of the ALT is to simulate the customer environment and thereby extrapolate the test results to the field, then selecting the best combination of stresses is important.

Not all customers have the same set of conditions in the field. Many customers experience more than two operating stresses in the field. It may be that four or more stresses may be present. Thus, selecting only two stresses will represent a compromise to field simulation. Add high levels of acceleration in each selected stress and complications arise. There may also be issues with non-linear behavior appearing in the test results.

This webinar will present approaches to selecting the best set of two stresses, showing ways to limit the test conditions and then handling some of the data analysis issues resulting from any non-linear test results. All of these considerations are important to achieving successful ALT results and then extrapolating these to the field.

To Register and for more info, please call 408.654.0499, x203

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January 30, 2016
IEEE Santa Clara Valley Reliability Chapter Meeting

Fracture Mechanics & Fatigue: Theory and Modeling for Mechanical Engineers
by Dr. Metin Ozen, ASME Fellow, Principal
Ozen Engineering Inc, Sunnyvale, CA
(co-sponsored ASME SCV Chapter)

Date: Saturday, January 30, 2016
Time: 9:00 AM - 4:00 PM
Location: Santa Clara University, CA 95054
Admission: ASME or IEEE Member: $80 per person, Non-Member: $120 per person; Student, Unemployed or Retired Member: $45 per person.

All in-person attendees will receive a light lunch. Breaks with snacks and drinks will be part of the seminar experience.

This course covers detailed information on the Fracture Mechanics and Fatigue theory as well as numerical modeling. The course reviews the fundamentals of fracture mechanics and fatigue; history, derivation of mathematical expressions for stress intensity factors; 2D versus 3D, crack tip stress field, three modes of fracture, maximum principal stress criterion, crack initiation and crack propagation, strain energy density theorem, J-Integral, mixed mode cracking, XFEM method, cohesive zone modeling, implementation of crack modeling in ANSYS Workbench, fatigue crack growth, stress/strain/energy based fatigue, numerical modeling of fatigue. Attendees will receive instructions to download free 30 days ANSYS/Mechanical software license at the end of the seminar (restrictions apply). Attendees will not need either the software installed on their system or experience with ANSYS to attend the seminar. Software can be downloaded after the seminar to practice the workshop problems demonstrated during the course.

Becoming certified as a Reliability Engineer (CRE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Reliability Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

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Jaunary 25-28, 2016 in Tucson, AZ
2016 Reliability and Maintainability Symposium

The Annual Reliability and Maintainability Symposium (RAMS®) is the premier event in the reliability, availability, and maintainability engineering disciplines. Combining tutorials, presentations, CEUs, certifications, and networking into one week-long program, the RAMS® delivers cutting edge information to all technical industries.

We have speakers at this conference so make a point to visit their sessions. And please stop by and say 'hi' to us at our booth!

For more information about this Conference, visit www.rams.org

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We look forward to seeing you at all of our events!

Jay and all the Ops Staff



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