Ops A La Carte Logo
Loading

calendarNews
Events

Blue Fading Rule

2015 EVENTS:

Click here for our public Google Calendar at Calendar of Events

Blue Fading Rule

2015 Free Webinar Series - First or Second Wednesday of Each Month 12pm-1:30pm PST

About Event: On the first or second Wednesday of each month, we will bring you a free webinar topic. Below is our next webinar. You can click on the registration page to register for event.

Blue Fading Rule

Coming Up is:

July 29, Aug 12, 19, 20; Sept 1, 3, 16, and 23, 2015 - Certified Reliability Engineer (CRE) Preparation Course
ASQ CRE Exam is on Oct 3, 2015

Time: 3:00pm-7:00pm Pacific time
Instructor: Les Warrington
Length: 8 sessions
Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed.
Location: Via webinar

Description: Becoming certified as a Reliability Engineer (CRE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Reliability Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

OR

Contact Us

Blue Fading Rule

August 5, 2015 - More on Reliability Demonstration Testing (RDT) and Ongoing Reliability Testing (ORT)

Host: Ops A La Carte
Speaker: Gerry Cohen, Senior Reliability/Quality Consultant
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/7714716006381367298

This webinar will provide a review of how to setup and conduct a Reliability Demonstration Test (RDT), and an Ongoing Reliability Test (ORT). Examples will be presented and discussed, and questions will be answered as time allows.

Blue Fading Rule

August 6, 2015 - IEEE Santa Clara Valley Reliability Chapter Meeting

Food sponsored by ICE Labs, ISO 9001 & 17025 Reliability Test Lab

Title: Macroscopic & Stochastic Aspects of Negative Bias Temperature Instability
Invited Speaker: Souvik Mahapatra, Professor of Electrical Engineering, Indian Institute of Technology Bombay, Mumbai, India
Time: Check in and food at 6:00PM - 6:30 PM
Presentation from 6:30 PM to 7:30 PM
Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria) (View Map)
Admission: Open to all IEEE members and non-members for FREE!

Abstract: Negative Bias Temperature Instability (NBTI) is a crucial reliability concern for modern day state-of-the-art CMOS technologies. NBTI results in shift in MOSFET parameters, such as threshold voltage, drain current, etc., over time, and therefore causes long-time failure of CMOS integrated circuits. It is very important to understand the fundamental physical mechanism responsible for NBTI and develop suitable models to predict device and resultant circuit degradation at end product life.

In this talk, the underlying physical processes responsible for NBTI in High-K Metal Gate (HKMG) MOSFETs will be briefly reviewed. Defect generation in MOSFET gate oxide will be explained from both macroscopic and stochastic viewpoints, which will be respectively useful to explain NBTI degradation in large and small area devices. This novel simulation framework can explain DC and AC NBTI degradation under various operating conditions such as different operating voltage, temperature, frequency and duty cycle in large area devices, as well as NBTI variability in small area devices. Furthermore, a compact model will be developed to simulate NBTI induced circuit degradation using SPICE simulation, and specific example of variable NBTI impact on SRAM performance parameters, such as read and hold static noise margin and write access time will be discussed.

For more information and to register, visit: Eventbrite Registration

Blue Fading Rule

Thursday, August 6, 2015 - IEEE Silicon Valley Discussion

http://www.ewh.ieee.org/r6/scv/rl/events.htm

When: Thu Aug 6, 2015 6:30pm 8:30pm Pacific Time
Where: Agilent Facility - 5301 Stevens Creek Blvd, Cupertino CA

Blue Fading Rule

Thursday, September 3, 2015 - IEEE Silicon Valley Discussion

http://www.ewh.ieee.org/r6/scv/rl/events.htm

When: Thu Sep 3, 2015 6:30pm 8:30pm Pacific Time
Where: Agilent Facility - 5301 Stevens Creek Blvd, Cupertino CA

Blue Fading Rule

September 9-11, 2015 - Boston, MA - 2015 2015 Accelerated Stress Testing and Reliability Conference

The 2015 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from reliability testing. ASTR 2015 is relevant to manufacturers in the aerospace, automotive, consumer electronics, defense, medical, telecommunications and other industries where reliability is a key driver of operational and business success. If your company needs to improve product testing with a goal to improve reliability, reduce warranty costs, improve profits, gain market share, and be more competitive, then the 2015 ASTR Conference is for you!

We have a number of speakers at this conference so make a point to visit their sessions. And please stop by and say 'hi' to us at our booth!

For more information about this Conference, visit www.ieee-astr.org

Blue Fading Rule

Thursday, October 1, 2015 - IEEE Silicon Valley Discussion

http://www.ewh.ieee.org/r6/scv/rl/events.htm

When: Thu Oct 1, 2015 6:30pm 8:30pm Pacific Time
Where: Agilent Facility - 5301 Stevens Creek Blvd, Cupertino CA

Blue Fading Rule

Thursday, November 5, 2015 - IEEE Silicon Valley Discussion

http://www.ewh.ieee.org/r6/scv/rl/events.htm

When: Thu Nov 5, 2015 6:30pm 8:30pm Pacific Time
Where: Agilent Facility - 5301 Stevens Creek Blvd, Cupertino CA

Blue Fading Rule

December 3, 2015 - IEEE Silicon Valley Discussion

http://www.ewh.ieee.org/r6/scv/rl/events.htm

When: Thu Dec 3, 2015 6:30pm 8:30pm Pacific Time
Where: Agilent Facility - 5301 Stevens Creek Blvd, Cupertino CA

Blue Fading Rule





blue rule

red arrow Many New Reliability Services & Reliability Seminars added! Click here for details >

blue rule

top of page