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2016 EVENTS:

Click here for our public Google Calendar at Calendar of Events

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2016 Free Webinar Series - First or Second Wednesday of Each Month 12pm-1:30pm PST

About Event: On the first or second Wednesday of each month, we will bring you a free webinar topic. Below is our next webinar. You can click on the registration page to register for event.

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Coming Up is:

May 4, 2016
FREE RELIABILITY WEBINAR - "Advantages of IEEE P1633 for Practicing Software Reliability"

Host: Ops A La Carte
Speaker: Ann Marie Neufelder, Founder, SoftRel LLC
Date: May 4, 2016
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/8970286823844085251

Software reliability engineering has existed for almost 50 years. Software reliability metrics such as failure rate, MTBF, availability and reliability have been used successfully in industry to plan, manage and demonstrate the achievement of system reliability objectives. The newly revised IEEE 1633 Recommended Practice for Software Reliability provides actionable step by step procedures for employing software reliability models and analyses during any phase of software or firmware development with any software lifecycle model for any industry or application type.

It includes easy to use models for predicting software reliability early in development and during test and operation. It also provides for methods to analyze software failure modes and include software in a system fault tree analysis.

For persons who are acquiring software it provides the ability to assess the reliability of COTS, FOSS, and contractor or subcontractor delivered software.

This presentation will cover the key features of the IEEE 1633 Recommended Practices for software reliability.

To Register and for more info, please call 408.654.0499, x203

March 3, 2016
IEEE Santa Clara Valley Reliability Chapter Meeting

Food sponsored by I.C.E. Labs, ISO 9001 & 17025 Reliability Test Lab

Title: Physics- based life distribution and reliability modeling of solid state drives
Invited Speaker: Dr. Alexander Parkhomovsky, Ph.D., Engineering Development Manager at Lumentum Date: Thursday, March 3, 2016 Time: Check in and food at 6:00PM - 6:30 PM. Presentation from 6:30 PM to 7:30 PM Location: Qualcomm Inc., 3165 Kifer Rd, Santa Clara, CA, 95051 (Meeting will be in the cafeteria, Building B)

Admission: Open to all IEEE members and non-members

Abstract: The model of solid state drive (SSD) life time distribution from physics-based life model considering the random nature of real world customer data usage and product inherent physical properties is developed. The talk is focused on the following two cases:

Case 1: When only field write duty cycle is treated as a random variable while assuming all other physical characteristics are non-random, it is found that the SSD life time follows . Reciprocal-Weibull distribution when field Write Duty Cycle follows Weibull distribution, . Reciprocal-Exponential distribution when field Write Duty Cycle follows Exponential distribution, . Lognormal distribution when field Write Duty Cycle follows Lognormal distribution, . Reciprocal-Normal Distribution when field Write Duty Cycle follows Normal distribution. The corresponding mathematical expressions for reliability, unreliability, hazard rate, MTTF, etc. are derived for each scenario accordingly.

Case 2: In real world, SSD endurance rating is also a random variable due to part-to-part variance from material in-homogeneity and inherent defects from manufacturing process. Given the distributions of field customer write duty cycle (stress) and SSD endurance rating (strength), the distribution of lifetime random variable can be derived either analytically, if closed form solution exists, or numerically using Monte Carlo simulation if no closed form solution exists. This paper provides a special case where the analytic solution exists when both random variables follow Lognormal distribution. A numerical example is given to show the application of the models developed in this paper. The results derived in this paper will benefit the SSD industry in various aspects of product design, development, reliability testing and prediction, field return/failure estimation and warranty management.

For more information and to register, visit: Eventbrite Registration

March 9, 2016
Free Webinar - HALT 101 - Back to Basics

Host: Ops A La Carte
Speaker: John Cooper, Senior Reliability Engineer
Time: 12:00pm-1:00pm Pacific Time
Register: https://attendee.gotowebinar.com/register/8806845518889777665

Many of us are involved in HALT testing; sometimes we wonder if we are doing it correctly or why it is done a certain way. Some of us may not understand it and would like a basic review.

This webinar will include an introduction to HALT, an understanding of what it will do, and what it will not do, and how to plan for it. We will explore fixturing, setup, functional verification, and the actual running of the test. We will discuss the real value of HALT.

Advanced topics will be touched on such as pitfalls of HALT, how it can be misunderstood, and some case studies.

Tune in to this webinar for a refresher; invite your associates, such as design engineers or project managers, who would appreciate understanding HALT and might have questions.

To Register and for more info, please call 408.654.0499, x203

March 17, 2016
5th Annual IEEE International Reliability Innovations Conference

Date: Thursday, March 17, 2016
Time: 8:00 AM - 45:00 PM (Breakfast & Lunch are provided)
Location: Juniper Networks (1194 North Mathilda Ave, Sunnyvale 94089. Building 1, Tuolumne Room)
Attendance: Registration is Free!! Attend on-site or Remote via WebEx

Join us on Thursday, March 17, 2016 for a day of learning, innovation and networking at the 5th Annual IEEE International Reliability Innovations Conference. The conference serves as a leading platform for engineering professionals to share innovative concepts, design, methodologies, tools and applications to address challenges in reliability. Engage in technical sessions, workshops, seminars and panel sessions on the latest advancement and network with like-minded professionals from all over the world.

The conference is brought to you by Cisco Systems, Juniper Networks and OPS Ala carte in collaboration with the IEEE Reliability Society (SCV Chapters), along with our prominent sponsors.

March 17, 2016
5th Annual IEEE International Reliability Innovations Conference

Join us on Thursday, March 17, 2016 for a day of learning, innovation and networking at the 5th Annual IEEE International Reliability Innovations Conference. The conference serves as a leading platform for engineering professionals to share innovative concepts, design, methodologies, tools and applications to address challenges in reliability. ... Read More

April 6, 2016Certified Quality Engineer (CQE) Preparation Course First Session

Date(s): Tentatively one session per week starting April 6, 2016, through Jun 1, 2016; ASQ CRE Exam is scheduled for Jun 4, 2016
Time: 3:00pm-7:00pm Pacific time
Instructor: Greg Swartz and Pat McMahon
Length: 9 sessions
Cost: $900. We offer 25% discount for unemployed or for students not getting reimbursed.
Location: Via webinar

Becoming certified as a Quality Engineer (CQE) can be valuable to your employer and your career. We have been offering this Exam Preparation Course for 15 years. Students have found it very valuable in preparing for the exam. Even if you are not planning on taking the exam but need a good, in-depth course in Quality Engineering, this can benefit you substantially.

To Register and for more info, please call 408.654.0499, x203

We look forward to seeing you at all of our events!

Jay and all the Ops Staff





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