"As a supplier of capital equipment to the semiconductor industry, the dependability of our test solutions is paramount. In our partnership with Ops A La Carte, we are applying the HALT methodology as a proactive tool to root out the key failure modes in our early and advanced prototypes--so that our pilot and production units deliver the dependability that our customers demand."
---Rick Casler, VP Engineering, Electroglas
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Education & Seminars
Fundamentals of Statistical Process Control (SPC)

COURSE OBJECTIVES
This Statistical Process Control (SPC) course presents a number of valuable tools to assist you in evaluating process variation and to make sound decisions based on your data. Topics covered included the following:

Pareto Charts and Check sheets for failure and Visual Data

Histograms for understanding variation in measurable data

Variables and Attribute Control Charts (including p Charts)

Process Capability and Yield Determination Studies

Correlation Studies with Guard-banding

Interpretation and Corrective Action including Out-Of-Control guidelines

Correlation and Regression

Download brochure (pdf)

LEARNING OBJECTIVES
Upon completion of this course, participants will be able to do the following:

Perform Yield Determination Studies

Construct p, NP, and C Charts for attribute process control

Be able to construct Ave. and Range control charts for variables data

Construct 90 and 95% Confidence

Distinguish between Process Control and Process Capability

Perform a Correlation Studies and interpret results

WHO SHOULD ATTEND
This course is intended for those involved in manufacturing process and test who want a better understanding of statistics in the manufacturing process for the purpose of making better decisions.

OUTLINE

Benefits of Metrics and SPC

SPC Tools and Implementation Strategy

Cause and Effect Diagrams (Fishbone)

Check Sheets

Pareto Analysis using Excel with Excel

Measures of Central Tendency and Variation

Histograms and Specification Limits with exercise using Excel

SPC vs. Process Capability

"Central Limit Theorem"

Cp and Cpk Indices - A Practical Approach

Yield Determination & Improvement

X Bar & R Chart

X Bar & S Charts (n>10) (for reference)

Short Run Charting Techniques

NP Charts

C Charts

P Charts (fraction defective)

Correlation Studies

Regression Analysis and Coefficients

Guard-banding for Process Optimization

Interpreting Trends and Shifts in Data

Planning Corrective Action

Implementing Continuous Process Improvement

Terms and Definitions
Formula Summary