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"I am pleased to entrust the courses that I have created to Ops a la Carte. I am confident that Mike Silverman and Fred Schenkelberg will present them effectively and that they will apply their own wide experience to develop them in line with changes in technology and methods" ---Patrick O'Connor, Author of Practical Reliability Engineering, Author of Test Engineering, Consultant
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EDUCATION on the best tools for Reliability Engineering.
INTEGRATION of all Elements of Reliability Programs for Maximum Value.
Public and In-House Courses presented by world-class instructors directly in Silicon Valley.
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Education & Seminars
Design for Testability (DfT)

OBJECTIVES
Our DfT course is based on Pat O'Connor's book "Test Engineering" and covers the following topics: Stress-strength and failure of materials and electronics, Variation and reliability, Design analysis, Development test principles, Materials and systems test, Electronics test, Software, Manufacturing test, Testing in service, Data collection and analysis, Managing tests, and Laws, regulations, standards.
Download brochure (pdf)

WHO SHOULD ATTEND This course is intended for those involved in manufacturing, design, or test, who want a better understanding of how to design a product to make it easier to test once in manufacturing.
 OUTLINE
Introduction
Why test
Causes of failures
How to test
Stress, Strength, and Failure of Materials
Material Properties
Causes of Strength Deterioration
Design against Fatigue
Wear Mechanisms
Wear Reduction
Corrosion
Other Mechanical Failure Mechanisms
Material Selection for Reliability/Durability
Stress, Strength, and Failure of Electronics
Stress Effects
Temperature Effects on Reliability
Semiconductor Device Technologies
Microcircuit Mounting and Connection
Semiconductor Device Failure Mechanisms
Passive Device Failure Mechanisms
Solder
Insulation
EMI
Electrical Overstress (EOS)
Electrostatic Discharge (ESD)
Variation and Reliability
Different Types of Distributions
Distributed Load and Strength
Design Analysis
Multiple variations/Design of Experiments
Confidence and risk
Statistical, scientific, and engineering confidence
Measures of reliability
Patterns of failure
Development Test Principles
Fundamental Principle of Test Development
Limits
Environments
Accelerated Stress Test
Highly Accelerated Life Test (HALT)
Accelerated Test vs. DOE
Electronics Test
Circuit Test Principles: Analog
Circuit Test Principles: Digital
Manual Test Equipment
Automated Test Equipment (ATE)
Test Capability
Design for Test (DfT)
Layout for ICT
Built-in Test (BIT)
EMI/EMC Test
Test Control and Data Acquisition
IC Test
Software
Hardware/Software Reliability Differences
Software Reliability
Error Reduction
Fault Tolerance
Languages
Software Testing
Documentation
Software Reliability Prediction and Measurement
Manufacturing Test
Test in Manufacturing
Manufacturing Test Principles
Test Capability
Manufacturing Test Economics
Stress Screening
HASS
Electronics Manufacturing Faults
Fault Proportions and Coverage
Assembly Test
Burn-In (ESS)
Integrating Stress Screening
Test in Service
Test schedule (continuous, operating cycles, calendar time)
BIT/BIST
No Fault Found
Reliability Centered Maintenance (RCM) Objectives
Maintenance Categories
Stress Screens for Repairs
Calibration
Data Collection and Analysis
FRACAS
Failure review board
Different types of databases
Linking databases across divisions/suppliers
Managing Tests
Test Procedures
Developing a Test Program
Testing Purchased Items
In-House vs. External Facilities
Project Test Plan
Manufacturing Test Plan
Management Issues
Future of Test
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